With the advancement of technology, the application of micro nano technology in various fields is becoming increasingly widespread, especially in precision control, microfabrication, nano characterization, and other areas. The demand for high-precision probes is rapidly increasing. The SW series soft tungsten probes have become a new favorite in the field of micro nano technology due to their innovative design and excellent performance, and are widely used in tasks such as micro nano scale operation, loading, and microfabrication.

The core innovation of the SW series soft tungsten probe lies in its unique design structure. The probe is based on a tungsten rod with a diameter of 0.5mm and a length of approximately 35mm, welded with a fine tungsten wire with a diameter less than 100 μ m, and processed into a probe with a nanoscale tip. This design not only ensures precise operation of the probe at the micro nano scale, but also provides good adjustability at the macro scale. The use of soft metal rods enables probes to have more suitable stiffness and flexible angle adjustment at large scales, which has significant advantages for precision micro nano operations, especially in narrow spaces.

In addition, the SW series soft tungsten probes also perform well in microfabrication and electrical characterization. Tungsten material itself has excellent hardness and wear resistance, ensuring that the probe is not easily worn during high-frequency operation. At the same time, the characteristics of the soft metal rod make the probe not only more flexible, but also effectively adaptable to different operating angles, improving the convenience and accuracy of operation.

In terms of chip level fault analysis, the application of SW series soft tungsten probes is also promising. As the size of semiconductor chips continues to decrease, traditional troubleshooting tools are unable to meet the increasingly complex requirements of fault analysis. The SW series probes, with their nanoscale tip design, can accurately locate tiny fault points on the surface of chips, quickly diagnose and repair faults, greatly improving the efficiency and accuracy of chip analysis.

In summary, the SW series soft tungsten probes not only demonstrate extremely high precision in micro nano scale operations, but also provide flexible adjustment capabilities at the macro scale through their excellent combination of flexibility and stiffness. This innovative design marks an important breakthrough in the operation of micro nano technology, indicating that in the future, there will be more precise and efficient tool support in fields such as microelectronics, nanofabrication, and fault diagnosis.